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Mattson Joins Big Three Silicon Valley Semiconductor Capital Equipment Suppliers - Purchases Sela Failure Analysis System
SANTA CLARA, Calif.-(Business Wire)-July 2, 2008 - Mattson Technology, Inc. (Nasdaq:MTSN) has purchased a Sela MC600i failure analysis tool and now joins the big three Silicon Valley front-end-of-line semiconductor equipment suppliers as an owner of the unique SEM sample preparation tool.
The MC600i system achieves fully automatic, reliable and rapid cross-sectioning of whole and partial wafers, significantly reducing the diagnostic cycle for both failure analysis and process monitoring. It specifically addresses the limitations of Focused Ion Beam (FIB) technology for sample preparation in the wafer fab.
Dr. Raj Singh, senior staff process engineer at Mattson Technology, noted, "The Sela microcleaving technology allows us to fine tune our processes for our customers and precisely isolate features on the wafer that demonstrates Mattson's superior tool capability and process effectiveness. The Sela tool is fast, efficient, convenient, and alleviates the need for manual preparation of the demo wafer, which is time consuming and cumbersome. With the Sela tool we can obtain accurate and usable results the first time."
OEMs and Wafer Manufacturers Purchase Failure Analysis Tool for SEM Cross Sectioning
"The Mattson purchase shows not only the importance of the Sela tool to the equipment marketplace," commented Oran Collins, Sela vice president, "but also the penetration of the major suppliers in Silicon Valley. We've always had an excellent adoption rate from top tier chip manufacturers; and now we can claim a similar success rate with equipment suppliers."
Over 280 Sela systems are installed at fabs, equipment and material suppliers and research institutes around the world. The MC600i was delivered and installed at Mattson in Q1'08.
About Sela: Sela, Ltd., is a leading supplier of automated SEM and TEM sample preparation equipment for the semiconductor industry. Sela's proprietary Microcleaving technology is unique in its ability to create precision cross-sections without water, chemical or mechanical contact, and to enable analysis of mirror images of a targeted feature. For more information, www.sela.com.
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